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Reliability analysis of large phased-mission systems with repairable components based on success-state sampling

机译：具有成功状态采样的具有可修复组件的大型相控系统的可靠性分析

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In many engineering applications, some phased-mission systems (PMS) may contain a large number of phases and repairable components. Traditional binary decision diagram (BDD) based methods or state-enumeration methods can suffer from the BDD explosion or the state explosion for this kind of PMS. This paper presents a non-simulation method for the reliability analysis of large PMS. In our approach, the system reliability is approximated by the system availability at discrete time. The discrete-time availability is modeled by the sampling of success states, which avoids the BDD explosion as the number of phases increases. Furthermore, BDDs are used to simplify success states, and enable our model to avoid the state-explosion problem. Two real-world PMS are analyzed to illustrate that the time and the storage cost of our approach do not increase exponentially with the number of components and phases in the PMS. (C) 2015 Elsevier Ltd. All rights reserved.
机译：在许多工程应用中，某些相控系统（PMS）可能包含大量相和可修复的组件。对于这种PMS，基于传统二进制决策图（BDD）的方法或状态枚举方法可能会遭受BDD爆炸或状态爆炸。本文提出了一种用于大型PMS可靠性分析的非仿真方法。在我们的方法中，系统可靠性可以通过离散时间的系统可用性来估算。离散时间可用性是通过对成功状态进行采样来建模的，这可以避免BDD在相数增加时发生爆炸。此外，BDD用于简化成功状态，并使我们的模型能够避免状态爆炸问题。对两个实际的PMS进行了分析，以说明我们的方法的时间和存储成本不会随PMS中组件和阶段的数量呈指数增长。 （C）2015 Elsevier Ltd.保留所有权利。

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