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An analytical framework for reliability growth of one-shot systems

机译:一站式系统可靠性增长的分析框架

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摘要

In this paper, we introduce a new reliability growth methodology for one-shot systems that is applicable to the case where all corrective actions are implemented at the end of the current test phase. The methodology consists of four model equations for assessing: expected reliability, the expected number of failure modes observed in testing, the expected probability of discovering new failure modes, and the expected portion of system unreliability associated with repeat failure modes. These model equations provide an analytical framework for which reliability practitioners can estimate reliability improvement, address goodness-of-fit concerns, quantify programmatic risk, and assess reliability maturity of one-shot systems. A numerical example is given to illustrate the value and utility of the presented approach. This methodology is useful to program managers and reliability practitioners interested in applying the techniques above in their reliability growth program.
机译:在本文中,我们为单次系统介绍了一种新的可靠性增长方法,该方法适用于在当前测试阶段结束时实施所有纠正措施的情况。该方法包括四个用于评估的模型方程式:预期可靠性,在测试中观察到的故障模式的预期数量,发现新故障模式的预期概率以及与重复故障模式相关的系统不可靠性的预期部分。这些模型方程式提供了一个分析框架,可靠性从业人员可以评估可靠性提高,解决拟合优度问题,量化程序风险以及评估一次性系统的可靠性成熟度。数值例子说明了所提出方法的价值和实用性。该方法学对有兴趣在其可靠性增长计划中应用上述技术的计划经理和可靠性从业者很有用。

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