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首页> 外文期刊>Reliability Engineering & System Safety >A Bayesian approach to degradation-based burn-in optimization for display products exhibiting two-phase degradation patterns
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A Bayesian approach to degradation-based burn-in optimization for display products exhibiting two-phase degradation patterns

机译：基于贝叶斯方法的基于劣化的老化优化显示产品具有两相劣化模式

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摘要

Motivated by the two-phase degradation phenomena observed in light displays (e.g., plasma display panels (PDPs), organic light emitting diodes (OLEDs)), this study proposes a new degradation-based burn-in testing plan for display products exhibiting two-phase degradation patterns. The primary focus of the burn-in test in this study is to eliminate the initial rapid degradation phase, while the major purpose of traditional burn-in tests is to detect and eliminate early failures from weak units. A hierarchical Bayesian bi-exponential model is used to capture two-phase degradation patterns of the burn-in population. Mission reliability and total cost are introduced as planning criteria. The proposed burn-in approach accounts for unit-to-unit variability within the burn-in population, and uncertainty concerning the model parameters, mainly in the hierarchical Bayesian framework. Available pre-burn-in data is conveniently incorporated into the burn-in decision-making procedure. A practical example of PDP degradation data is used to illustrate the proposed methodology. The proposed method is compared to other approaches such as the maximum likelihood method or the change-point regression. (C) 2016 Elsevier Ltd. All rights reserved.
机译：受光显示器（例如，等离子显示面板（PDP），有机发光二极管（OLED））中观察到的两相降解现象的影响，这项研究提出了一种新的基于降解的老化测试计划，用于显示具有以下特征的显示产品：相降解模式。本研究中老化测试的主要重点是消除初始的快速降解阶段，而传统老化测试的主要目的是检测并消除薄弱部件的早期故障。分层贝叶斯双指数模型用于捕获老化人口的两阶段降解模式。将任务可靠性和总成本作为计划标准。拟议的老化方法考虑了老化人口中单位之间的差异以及模型参数的不确定性，主要是在分层贝叶斯框架中。可用的预老化数据可以方便地合并到老化决策过程中。 PDP降级数据的一个实际示例用于说明所提出的方法。将该方法与其他方法（例如最大似然法或变化点回归）进行了比较。 （C）2016 Elsevier Ltd.保留所有权利。

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