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A small-angle x-ray scattering system with a vertical layout

机译：具有垂直布局的小角度X射线散射系统

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摘要

A small-angle x-ray scattering (SAXS) system with a vertical layout (V-SAXS) has been designed and constructed for in situ detection on nanostructures, which is well suitable for in situ study on self-assembly of nanoparticles at liquid interface and polymer processing. A steel-tower frame on a reinforced basement is built as the supporting skeleton for scattering beam path and detector platform, ensuring the system a high working stability and a high operating accuracy. A micro-focus x-ray source combining parabolic three-dimensional multi-layer mirror and scatteringless collimation system provides a highly parallel beam, which allows us to detect the very small angle range. With a sample-to-detector distance of 7 m, the largest measurable length scale is 420 nm in real space. With a large sample zone, it is possible to install different experimental setups such as film stretching machine, which makes the system perfect to follow the microstructures evolution of materials during processing. The capability of the V-SAXS on in situ study is tested with a drying experiment of a free latex droplet, which confirms our initial design.
机译：设计并构建了具有垂直布局的小角度X射线散射（SAXS）系统（V-SAXS），用于纳米结构的原位检测，非常适合于纳米粒子在液体界面上的自组装的原位研究。和聚合物加工。加固地下室中的钢制塔架被用作散射光束路径和检测器平台的支撑框架，从而确保系统具有较高的工作稳定性和较高的操作精度。结合了抛物线三维多层反射镜和无散射准直系统的微焦点X射线源提供了高度平行的光束，这使我们能够检测到非常小的角度范围。样品到检测器的距离为7 m，实际空间中最大的可测量长度比例为420 nm。对于较大的样品区域，可以安装不同的实验装置，例如薄膜拉伸机，这使得该系统非常适合在加工过程中跟踪材料的微观结构演变。 V-SAXS在原位研究中的能力通过游离乳胶液滴的干燥实验进行了测试，这证实了我们的初步设计。

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