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首页> 外文期刊>Review of Scientific Instruments >A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies
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A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies

机译：基于分段型衍射晶体的von Hamos X射线光谱仪，用于单次X射线发射光谱和时间分辨共振非弹性X射线散射研究

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摘要

We report on the design and performance of a wavelength-dispersive type spectrometer based on the von Hamos geometry. The spectrometer is equipped with a segmented-type crystal for x-ray diffraction and provides an energy resolution in the order of 0.25 eV and 1 eV over an energy range of 8000 eV–9600 eV. The use of a segmented crystal results in a simple and straightforward crystal preparation that allows to preserve the spectrometer resolution and spectrometer efficiency. Application of the spectrometer for time-resolved resonant inelastic x-ray scattering and single-shot x-ray emission spectroscopy is demonstrated.
机译：我们报告了基于von Hamos几何形状的波长色散型光谱仪的设计和性能。该光谱仪配备了用于X射线衍射的分段型晶体，在8000 eV–9600 eV的能量范围内提供了0.25 eV和1 eV量级的能量分辨率。分段晶体的使用导致简单，直接的晶体制备，从而可以保留光谱仪的分辨率和光谱仪的效率。证明了该光谱仪在时间分辨共振非弹性X射线散射和单发X射线发射光谱中的应用。

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