Digitally tunable, wide-band amplitude, phase, and frequency detection for atomic-resolution scanning force microscopy

Khan Z.; Leung C.; Tahir B. A.; Hoogenboom B. W.

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Digitally tunable, wide-band amplitude, phase, and frequency detection for atomic-resolution scanning force microscopy

机译：用于原子分辨率扫描力显微镜的数字可调宽带幅度，相位和频率检测

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Frequency-modulation atomic force microscopy (FM-AFM) relies on an accurate tracking of the resonance frequency of a scanning probe. It is now used in environments ranging from ultrahigh vacuum to aqueous solutions, for slow and for fast imaging, with probes resonating from a few kilohertz up to several megahertz. Here we present a versatile experimental setup that detects amplitude, phase, and frequency of AFM probes for resonance frequencies up to 15 MHz and with >70 kHz maximum bandwidth for amplitude/phase detection. We provide generic parameter settings for variable-bandwidth frequency detection and test these using our setup. The signal-to-noise ratio of the frequency detector is sufficiently high to record atomic-resolution images of mica by FM-AFM in aqueous solution.

机译：调频原子力显微镜（FM-AFM）依赖于对扫描探针共振频率的精确跟踪。现在，它可用于从超高真空到水溶液的各种环境中，以实现慢速和快速成像，探头的共振频率从几千赫兹到几兆赫兹不等。在这里，我们提供了一种通用的实验设置，可检测AFM探头的振幅，相位和频率，以获取高达15 MHz的谐振频率，并具有大于70 kHz的最大带宽用于振幅/相位检测。我们提供用于可变带宽频率检测的通用参数设置，并使用我们的设置进行测试。频率检测器的信噪比足够高，可以通过FM-AFM在水溶液中记录云母的原子分辨率图像。

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《Review of Scientific Instruments》 |2010年第7期|P.073704-073704-5|共5页
作者
Khan Z.; Leung C.; Tahir B. A.; Hoogenboom B. W.;
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London Centre for Nanotechnology, University College London, 17-19 Gordon Street, London WC1H 0AH, United Kingdom;

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1. Digitally tunable, wide-band amplitude, phase, and frequency detection for atomic-resolution scanning force microscopy [J] . Z. Khan, C. Leung, B. A. Tahir, Review of Scientific Instruments . 2010,第7期

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2. Detection of secondary phases in duplex stainless steel by magnetic force microscopy and scanning Kelvin probe force microscopy [J] . J. Ramirez-Salgado, M.A. Dominguez-Aguilar, B. Castro-Dominguez Materials Characterization . 2013,第Null期

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3. Highly Sensitive Electrostatic Force Detection Using Small Amplitude Frequency-Modulation Atomic Force Microscopy in the Second Flexural Mode [J] . Keisuke Nishi, Yoshihiro Hosokawa, Kei Kobayashi, Transactions of the Japan Society for Computational Engineering and Science . 2011,第5期

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4. Voltage amplitude and voltage phase mapping within sub-/spl mu/m devices by high frequency scanning force microscopy [C] . Leyk, A., Bohm, . 1996

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6. Frequency amplitude and phase measurements in contact resonance atomic force microscopies [O] . Gheorghe Stan, Santiago D Solares 2014

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7. Combined frequency modulated atomic force microscopy and scanning tunneling microscopy detection for multi-tip scanning probe microscopy applications [O] . Morawski, Ireneusz, Spiegelberg, Richard, Korte, Stefan, 2015

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8. Atomic Force MIcroscopy and Scanning Tunneling Microscopy with a Combination Atomic Force Microscope/Scanning Tunneling Microscopy [R] . Marti, O., Drake, B., Gould, S., 1988

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Digitally tunable, wide-band amplitude, phase, and frequency detection for atomic-resolution scanning force microscopy

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