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首页> 外文期刊>Review of Scientific Instruments >Time‐integrated x‐ray measurements of the very energetic electron end loss profile in TMX‐U
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Time‐integrated x‐ray measurements of the very energetic electron end loss profile in TMX‐U

机译：TMX‐U中高能电子末端损耗曲线的时间积分X射线测量

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The time‐integrated 2D profile of the thick‐target bremsstrahlung produced by energetic end loss electrons has been measured during electron cyclotron resonance heating (ECRH) operation of TMX‐U. Sheets of x‐ray film and/or arrays of thermoluminescent dosimeters were placed on the outside of the end tank end wall to measure the relative spatial x‐ray profile, with locally added filters of Pb to determine the effective mean x‐ray energy. The purpose of this simple survey diagnostic was to allow deduction of the gross features of the ECRH region. The electron source functions needed to fit the x‐ray data were modeled for various anchor cell radial distributions mapped along magnetic field lines to the elliptical plasma potential control plates or the Al end walls. The data are generally consistent with (1) major ECR heating in the central 25‐cm‐diameter core, (2) a mean ECRH electron‐loss energy of 420 keV, and (3) and ECRH coupling efficiency to these hot electrons of ≥10%.
机译：在TMX-U的电子回旋共振加热（ECRH）操作期间，已经测量了由高能端损失电子产生的厚目标致辐射的时间积分2D轮廓。将X射线胶片片和/或热辐射剂量计阵列放置在末端储罐端壁的外侧，以测量相对空间X射线轮廓，并局部添加Pb滤光片以确定有效的平均X射线能量。这种简单的调查诊断的目的是要扣除ECRH地区的总体特征。对适合X射线数据的电子源功能进行了建模，以模拟沿着磁场线映射到椭圆形等离子电势控制板或Al端壁的各种锚定单元径向分布。数据通常与（1）直径25 cm中心核心的主要ECR加热，（2）420 keV的平均ECRH电子损耗能量以及（3）≥≥这些热电子的ECRH耦合效率相一致。 10％。

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