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首页> 外文期刊>Review of Scientific Instruments >Time‐resolved x‐ray line intensities for diagnostics of laser‐produced plasmas (abstract)
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Time‐resolved x‐ray line intensities for diagnostics of laser‐produced plasmas (abstract)

机译:时间分辨的X射线线强度,用于诊断激光产生的等离子体(抽象)

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We have developed a streaked crystal spectrograph for time‐resolving x‐ray lines from laser‐produced plasmas. The spectrograph combines an ellipsoidally curved crystal and x‐ray streak camera to optimize spectral coverage and resolution, even though the instrument is located a meter from the source. The instrument has been used at Novette to measure S lines doped in concentrations of 4% in the center of CH foils. Time histories of the temperature and density of the CH plasma have been derived from relative intensities of the S lines. Details of the experiment and analysis will be presented along with the instrument design.
机译:我们开发了一种条纹晶体光谱仪,用于从激光产生的等离子体中及时分辨X射线线。光谱仪结合了椭圆形弯曲的晶体和X射线条纹相机,即使仪器距离源头一米,也可以优化光谱覆盖范围和分辨率。该仪器已在Novette用于测量CH箔中心掺杂浓度为4%的S线。 CH等离子体的温度和密度的时间历史记录已从S线的相对强度得出。实验和分析的详细信息将与仪器设计一起提供。

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