A method for testing the performance of a dual-core microcontroller with integrated program and data memory

Krzysztof SIECZKOWSKI; Tadeusz SONDEJ

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A method for testing the performance of a dual-core microcontroller with integrated program and data memory

机译：一种用于测试具有集成程序和数据存储器的双核微控制器的性能的方法

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摘要

The paper presents a set of test procedures for performing an extended test of dual-core microcontroller performance. The procedures described enable the performance of the system to be determined with regard to memory organization, mutual influence of cores and ability to verify the impact of code optimization level. The experimental trials were performed using an LPC4357 microcontroller with onboard FLASH and SRAM memory. The results obtained showed a slight performance drop for the various microcontrollers operating simultaneously in typical conditions. However, with frequent references to a shared memory, the performance drop may reach as much as 80%.

机译：本文介绍了一套用于对双核微控制器性能进行扩展测试的测试程序。所描述的过程使得可以确定有关内存组织，内核的相互影响以及验证代码优化级别的影响的能力的系统性能。使用带有板载FLASH和SRAM存储器的LPC4357微控制器进行了实验性试验。获得的结果表明，在典型条件下同时运行的各种微控制器的性能略有下降。但是，如果频繁引用共享内存，性能下降可能会达到80％。

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来源
《Pomiary Automatyka Kontrola》 |2015年第7期|320-322|共3页
作者
Krzysztof SIECZKOWSKI; Tadeusz SONDEJ;
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作者单位

ELECTRONIC DEPARTMENT, MILITARY UNIVERSITY OF TECHNOLOGY THEM. JAROSLAW DABROWSKI 2 Gen. Sylvester Kaliski St., 00-908 Warsaw 49, Poland;

ELECTRONIC DEPARTMENT, MILITARY UNIVERSITY OF TECHNOLOGY THEM. JAROSLAW DABROWSKI 2 Gen. Sylvester Kaliski St., 00-908 Warsaw 49, Poland;

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正文语种 eng
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关键词
microcontroller; multicore; performance; benchmark;

机译：微控制器;多核性能;基准;

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A method for testing the performance of a dual-core microcontroller with integrated program and data memory

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