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首页> 外文期刊>Science, Measurement & Technology, IET >Influence of electronic scavenger additives on AC breakdown voltage of synthetic ester
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Influence of electronic scavenger additives on AC breakdown voltage of synthetic ester

机译：电子清除剂添加剂对合成酯交流击穿电压的影响

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摘要

This study deals with the influence of two kinds of electronic scavenger additives/compounds, namely methyl iodide (iodomethane), CH3I, and carbon tetrachloride CCl(4)on the breakdown voltage (U-BDV) of MIDEL 7131 synthetic ester (SE). The tests are conducted under 60 Hz AC voltage according to the IEC 60156 standard, for various concentrations of additives ranging 0-600 ppm. Statistical analysis is performed to check whether the experimental data obey the most used probabilistic distributions for electrical BDVs, namely normal and Weibull laws. The estimation of the BDV with risk probabilities of 1 and 50% are also deduced. It is shown that the average BDV of SE increases with the concentration of both additives up to an optimum value beyond which it decreases; the optimum concentration for both cases is 400 ppm. The improvement of the averageU(BDV)is about 27% with CH3I and 21% with CCl4. The values ofU(BDV)conform to Weibull distribution with CH3I; it is also the case with CCl4, except for 200 ppm.
机译：该研究涉及两种电子清除剂添加剂/化合物，即甲基碘（碘甲烷），CH3I和四氯化碳CCl（4）对MIDEL 7131合成酯（SE）的击穿电压（U-BDV）的影响。根据IEC 60156标准，该试验在60 Hz AC电压下进行，用于各种浓度的添加剂，范围为0-600ppm。进行统计分析以检查实验数据是否遵守电气BDV的最常用的概率分布，即正常和Weibull法。还推导出具有1和50％的风险概率的BDV的估计。结果表明，SE的平均BDV随着两种添加剂的浓度增加，其达到其降低的最佳值;两种情况的最佳浓度为400ppm。均线（BDV）的改善约27％，CCL4为CCCl4约27％。用CH3i符合u（bdv）的值符合威布尔分布;除了200ppm之外，还有CCL4的情况。

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