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Development of a new holographic method with resonant X-ray scattering

机译:共振X射线散射的全息新方法的开发

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Complex X-ray holography (CXH) using resonant scattering is proposed as a new atomic resolution holography method. CXH provides us a solution for the twin-image problem as well as elemental identification in real space. Accurate differences among intensities recorded at several X-ray energies around an absorption edge must be experimentally obtained in the CXH method. Taking into account that the holographic signal is of the order of 0.1% of its background, we find it difficult to carry out using ordinary technique for hologram measurement. Thus, in order to measure holograms with a very good S/N ratio, a sample was cooled about 100 K and fluorescent X-rays were focused on a detector with a cylindrical graphite analyzer in the X-ray fluorescence holography apparatus at SPring-8. Ga fluorescent holograms of GaAs were recorded at energies near the As K absorption edge. A change of holographic oscillations due to the resonant scattering, which is expected from the computer simulation, was firstly observed.
机译:提出了一种利用共振散射的复杂X射线全息术(CXH)作为一种新的原子分辨率全息术。 CXH为我们提供了双图像问题以及实际空间中元素识别的解决方案。必须在CXH方法中通过实验获得在吸收边缘附近的几种X射线能量下记录的强度之间的准确差异。考虑到全息信号约为其背景的0.1%,我们发现很难使用普通技术进行全息图测量。因此,为了以良好的信噪比测量全息图,将样品冷却至约100 K,并将荧光X射线聚焦在SPring-8的X射线荧光全息设备中的带有圆柱形石墨分析仪的检测器上。在As K吸收边缘附近的能量处记录了GaAs的Ga荧光全息图。首先观察到由于共振散射引起的全息振荡的变化,这是计算机模拟所预期的。

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