...
首页> 外文期刊>The Science of the Total Environment >Effects of etching time on alpha tracks in solid state nuclear track detectors
【24h】

Effects of etching time on alpha tracks in solid state nuclear track detectors

机译:刻蚀时间对固态核径迹探测器中α径迹的影响

获取原文
获取原文并翻译 | 示例
           

摘要

Solid State Nuclear Track Detectors (SSNTDs) are used extensively for monitoring alpha particle radiation, neutron flux and cosmic ray radiation. Radon gas inhalation is regarded as being a significant contributory factor to lung cancer deaths in the UK each year. Gas concentrations are often monitored using CR39 based SSNTDs as the natural decay of radon results in alpha particles which form tracks in these detectors. Such tracks are normally etched for about 4 h to enable microscopic analysis. This study examined the effect of etching time on the appearance of alpha tracks in SSNTDs by collecting 2D and 3D image datasets using laser confocal microscope imaging techniques. Etching times of 2 to 4 h were compared and marked differences were noted in resultant track area. The median equivalent diameters of tracks were 20.2,30.2 and 38.9 μm for etching at 2,3 and 4 h respectively. Our results indicate that modern microscope imaging can detect and image the smaller size tracks seen for example at 3 h etching time. Shorter etching times may give rise to fewer coalescing tracks although there is a balance to consider as smaller track sizes may be more difficult to image. Thus etching for periods of less than 4 h clearly merits further investigation as this approach has the potential to improve accuracy in assessing the number of tracks.
机译:固态核径迹探测器(SSNTD)广泛用于监视α粒子辐射,中子通量和宇宙射线辐射。每年,在英国,吸入气被认为是导致肺癌死亡的重要因素。经常使用基于CR39的SSNTD监测气体浓度,因为of的自然衰变会导致在这些探测器中形成轨道的α粒子。通常将此类磁道蚀刻约4小时,以进行微观分析。这项研究通过使用激光共聚焦显微镜成像技术收集2D和3D图像数据集,研究了蚀刻时间对SSNTD中alpha轨迹外观的影响。比较了2至4小时的蚀刻时间,并且在所得的轨迹区域中注意到明显的差异。在2,3和4 h刻蚀时,磁道的中值等效直径分别为20.2、30.2和38.9μm。我们的结果表明,现代显微镜成像可以检测和成像较小尺寸的轨迹,例如在3 h蚀刻时看到的轨迹。较短的蚀刻时间可能会产生较少的聚结轨迹,但要考虑到一个平衡点,因为较小的轨迹尺寸可能更难以成像。因此,蚀刻时间少于4小时显然值得进一步研究,因为这种方法有可能提高评估磁道数量的准确性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号