A Study of Crosstalk in a <inline-formula> <tex-math notation='LaTeX'>$256 times 256$ </tex-math></inline-formula> Photon Counting Imager Based on Silicon Geiger-Mode Avalanche Photodiodes

Aull B.F.; Schuette D.R.; Young D.J.; Craig D.M.; Felton B.J.; Warner K.

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$256 times 256$

Photon Counting Imager Based on Silicon Geiger-Mode Avalanche Photodiodes

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A Study of Crosstalk in a $256 times 256$ Photon Counting Imager Based on Silicon Geiger-Mode Avalanche Photodiodes

机译：基于硅Geiger模式雪崩光电二极管的 $ 256×256 $ 光子计数成像器的串扰研究

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We demonstrate a passive photon counting imager based on hybridization of back-illuminated silicon Geiger-mode avalanche photodiodes to an all-digital CMOS counting chip. Photon detection efficiencies in the 10%–20% are observed at visible wavelengths. The detection efficiency is currently limited by optical crosstalk that leads to elevation of dark count rates as the bias voltage on the photodiodes is increased. Both the time dependence of dark count activity during a gate time and the spatial structure of dark images were successfully explained using crosstalk-based models.

机译：我们展示了一种基于背照式硅盖革模式雪崩光电二极管与全数字CMOS计数芯片的混合的无源光子计数成像器。在可见波长处观察到的光子检测效率为10％–20％。当前，检测效率受到光学串扰的限制，随着光电二极管上偏置电压的增加，光学串扰会导致暗计数率的升高。使用基于串扰的模型，成功地解释了选通时间内暗计数活动的时间依赖性和暗图像的空间结构。

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来源
《Sensors Journal, IEEE》 |2015年第4期|2123-2132|共10页
作者
Aull B.F.; Schuette D.R.; Young D.J.; Craig D.M.; Felton B.J.; Warner K.;
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作者单位

, MIT Lincoln Laboratory, Lexington, MA, USA;

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原文格式 PDF
正文语种 eng
中图分类
关键词
Arrays; CMOS integrated circuits; Crosstalk; Detectors; Photonics; Silicon; Geiger mode; Geiger-mode; Image sensors; SPAD array; avalanche photodiodes; breakdown voltage; dark count rate; detectors; diodes; p-n junctions; photodetectors; quantum efficiency; signal detection; silicon; single-photon avalanche diodes; single-photon counting; single-photon detection; singlephoton counting;

机译：阵列;CMOS集成电路;串扰;检测器;光子学;硅;盖革模式;盖革模式;图像传感器;SPAD阵列;雪崩光电二极管;击穿电压;暗计数率;探测器;二极管;pn结;光电探测器;量子效率;信号检测;硅;单光子雪崩二极管;单光子计数;单光子检测;单光子计数;

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机译：256 $ times $ 基于免校准的带有循环插值器的TDC阵列 $ 2 { times $$ 时间放大器
2. A $160 times 120$ Pixel Analog-Counting Single-Photon Imager With Time-Gating and Self-Referenced Column-Parallel A/D Conversion for Fluorescence Lifetime Imaging [J] . Perenzoni Matteo, Massari Nicola, Perenzoni Daniele, Solid-State Circuits, IEEE Journal of . 2016,第1期

机译： $ 160乘以120 $ 具有时间门控和自引用列的像素模拟计数单光子成像器-并行A / D转换，用于荧光寿命成像
3. An $80imes25$ Pixel CMOS Single-Photon Sensor With Flexible On-Chip Time Gating of 40 Subarrays for Solid-State 3-D Range Imaging [J] . Ruokamo Henna, Hallman Lauri W., Kostamovaara Juha IEEE Journal of Solid-State Circuits . 2019,第2期

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4. Photon counting imagers based on high-fill-factor silicon geiger-mode avalanche photodiode arrays [C] . Aull Brian F., Schuette Daniel R., Young Douglas J., IEEE Photonics Conference . 2014

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5. Fast single photon avalanche photodiode-based time-resolved diffuse optical tomography scanner [O] . Ying Mu, Mark Niedre 2015

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6. A Compact Resistor-Based CMOS Temperature Sensor With an Inaccuracy of 0.12 °C (3 $sigma$ ) and a Resolution FoM of 0.43 pJ $cdot$ K $^{2}$ in 65-nm CMOS [O] . Woojun Choi, Yongtae Lee, Seonhong Kim, 2018

机译：基于紧凑的电阻式CMOS温度传感器，其不准确为0.12°C（3 $ Sigma $ ）和0.43 pj $ cdot $ k $ ^ {2} $ 65-nm cmos
7. Photoionization of Trapped Carriers in Avalanche Photodiodes to Reduce Afterpulsing During Geiger-Mode Photon Counting [R] . Krainak, Michael A. 2005

机译：雪崩光电二极管中被困载流子的光电离，以减少盖格模式光子计数期间的脉冲后脉动

A Study of Crosstalk in a $256 times 256$ Photon Counting Imager Based on Silicon Geiger-Mode Avalanche Photodiodes

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