Ratio-Based Temperature-Sensing Technique Hardened Against Nanometer Process Variations

Ituero P.; Lopez-Vallejo M.

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Ratio-Based Temperature-Sensing Technique Hardened Against Nanometer Process Variations

机译：基于比率的温度传感技术，可抵抗纳米工艺变化

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This letter presents a temperature-sensing technique on the basis of the temperature dependency of MOSFET leakage currents. To mitigate the effects of process variation, the ratio of two different leakage current measurements is calculated. Simulations show that this ratio is robust to process spread. The resulting sensor is quite small-0.0016 ${rm mm}^{2}$ including an analog-to-digital conversion—and very energy efficient, consuming less than 640 pJ/conversion. After a two-point calibration, the accuracy in a range of 40$^{circ}{rm C}$–110 $^{circ}{rm C}$ is less than 1.5$^{circ}{rm C}$ , which makes the technique suitable for thermal management applications.

机译：这封信提出了一种基于MOSFET漏电流的温度依赖性的温度传感技术。为了减轻过程变化的影响，计算了两个不同泄漏电流测量值的比率。仿真表明，该比率对过程扩展具有鲁棒性。所得的传感器非常小-0.0016 $ {rm mm} ^ {2} $ ，包括模数转换—且非常节能，每次转换消耗的能量小于640 pJ。经过两点校准后，精度在40 $ ^ {circ} {rm C} $ –110范围内 $ ^ {circ} {rm C} $ 小于1.5 $ ^ {circ} {rm C} $ ，这使该技术适用于热管理应用。

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来源
《Sensors Journal, IEEE》 |2013年第2期|p.442-443|共2页
作者
Ituero P.; Lopez-Vallejo M.;
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作者单位

Integrated Systems Laboratory, Department of Electronic Engineering, ETSI Telecomunicación, Universidad Politécnica de Madrid, Madrid, Spain;

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原文格式 PDF
正文语种 eng
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关键词
Current measurement; Leakage current; Temperature dependence; Temperature measurement; Temperature sensors; Thermal management; Voltage measurement; Leakage; process variations; ratio-based; sensor; temperature; time-to-digital;

机译：电流测量;漏电流;温度依赖性;温度测量;温度传感器;热管理;电压测量泄漏;工艺变化;基于比率传感器;温度;数字化时间;

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7. Ratio-based temperature-sensing technique hardened against nanometer process variations [O] . Ituero Herrero Pablo, López Vallejo Marisa 2013

机译：基于比率的温度感测技术可抵抗纳米工艺变化

Ratio-Based Temperature-Sensing Technique Hardened Against Nanometer Process Variations

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