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Microwave Sensor for Detection of Solid Material Permittivity in Single/Multilayer Samples With High Quality Factor

机译:微波传感器,用于高品质因数的单/多层样品中固体物质介电常数的检测

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摘要

In this paper, a planar microstrip sensor based on a band-stop filter for determining relative permittivity of solid materials is presented. The proposed sensor has been composed of the structure of meandered microstrip line with a T-shaped resonator and an interdigital structure that is connected ground by via. Interaction between the T-shaped resonator and the interdigital structure is caused to increase electric field intensity and the high field increase the sensor sensitivity and resolution. The microwave sensor by using single layer technology is fabricated on the substrate RO4003. The samples of FR4 and RO4350 in single and double layer forms as multilayer are placed on the sensor, and the sensor is demonstrating different resonance frequencies. The relationship between changing the resonance frequency and variation of the relative permittivity is linear, and it determines unknown materials' dielectric characterizations. The permittivity of samples changes from 3 to 11; therefore, the resonance frequency varies from 3.7 to 5.65 GHz linearly. The proposed sensor shows improvement relative to other similar works in the fields of sensitivity and quality factor.
机译:本文提出了一种基于带阻滤波器的平面微带传感器,用于确定固体材料的相对介电常数。所提出的传感器由具有T形谐振器的蜿蜒微带线结构和通过通孔接地的叉指结构组成。导致T形谐振器和叉指结构之间的相互作用增加了电场强度,而高电场则增加了传感器的灵敏度和分辨率。通过使用单层技术的微波传感器被制造在基板RO4003上。将单层和双层形式的FR4和RO4350样品作为多层放置在传感器上,并且该传感器显示出不同的共振频率。改变共振频率与相对介电常数变化之间的关系是线性的,它决定了未知材料的介电特性。样品的介电常数从3变为11;因此,谐振频率在3.7至5.65 GHz之间线性变化。相对于其他类似工作,在灵敏度和品质因数方面,提出的传感器显示出改进。

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