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Assessment of temperature effect in structural health monitoring with piezoelectric wafer active sensors

机译：利用压电晶片有源传感器评估结构健康监测中的温度效应

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摘要

This paper presents theoretical and experimental evaluation of the structural health monitoring (SHM) capability of piezoelectric wafer active sensors (PWAS) at elevated temperatures. This is important because the technologies for structural sensing and monitoring need to account for the thermal effect and compensate for it. Permanently installed PWAS transducers have been One of the extensively employed sensor technologies for in-situ continuous SHM. In this paper, the electro-mechanical impedance spectroscopy (EMIS) method has been utilized as a dynamic descriptor of PWAS behavior and as a high frequency standing wave local modal technique. Another SHM technology utilizes PWAS as far-field transient transducers to excite and detect guided waves propagating through the structure. This paper first presents how the EMIS method is used to qualify and quantify circular PWAS resonators in an increasing temperature environment up to 230 deg C. The piezoelectric material degradation with temperature was investigated and trends of variation with temperature were deduced from experimental measurements. These effects were introduced in a wave propagation simulation software called Wave Form Revealer (WFR). The thermal effects on the substrate material were also considered. Thus, the changes in the propagating guided wave signal at various temperatures could be simulated. The paper ends with summary and conclusions followed by suggestions for further work.
机译：本文提出了在高温下压电晶片有源传感器（PWAS）的结构健康监测（SHM）能力的理论和实验评估。这很重要，因为用于结构感测和监视的技术需要考虑热效应并对其进行补偿。永久安装的PWAS传感器已成为现场连续SHM广泛采用的传感器技术之一。在本文中，机电阻抗谱（EMIS）方法已被用作PWAS行为的动态描述子和高频驻波局部模态技术。另一种SHM技术利用PWAS作为远场瞬态换能器来激发和检测在结构中传播的导波。本文首先介绍了如何使用EMIS方法对高达230摄氏度的高温环境中的圆形PWAS谐振器进行鉴定和定量。研究了压电材料随温度的退化，并从实验测量中推导了随温度变化的趋势。这些效应是在名为Wave Form Revealer（WFR）的波传播仿真软件中引入的。还考虑了对基板材料的热效应。因此，可以模拟在各种温度下传播的导波信号的变化。本文以总结和结论结尾，随后提出了进一步工作的建议。

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