...
首页> 外文期刊>IEEE Journal of Solid-State Circuits >Design and characterization of analog VLSI neural network modules
【24h】

Design and characterization of analog VLSI neural network modules

机译:模拟VLSI神经网络模块的设计与表征

获取原文
获取原文并翻译 | 示例
           

摘要

A systematic method for testing large arrays of analog, digital, or mixed-signal circuit components that constitute VLSI neural networks is described. This detailed testing procedure consists of a parametric test and a behavioral test. Characteristics of the input neuron, synapse, and output neuron circuits are used to distinguish between faulty and useful chips. Stochastic analysis of the parametric test results can be used to predict chip yield information. Several measurement results from two analog neural network processor designs that are fabricated in 2 mu m double-polysilicon CMOS technologies are presented to demonstrate the testing procedure.
机译:描述了一种用于测试构成VLSI神经网络的大型模拟,数字或混合信号电路组件阵列的系统方法。这个详细的测试过程包括参数测试和行为测试。输入神经元,突触和输出神经元电路的特征用于区分故障芯片和有用芯片。参数测试结果的随机分析可用于预测芯片成品率信息。给出了两种以2微米双多晶硅CMOS技术制造的模拟神经网络处理器设计的测量结果,以演示测试过程。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号