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首页> 外文期刊>IEEE Journal of Solid-State Circuits >Transistor and Circuit Design for 100-200-GHz ICs
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Transistor and Circuit Design for 100-200-GHz ICs

机译:100-200GHz IC的晶体管和电路设计

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摘要

Compared to SiGe, InP HBTs offer superior electron transport properties but inferior scaling and parasitic reduction. Figures of merit for mixed-signal ICs are developed and HBT scaling laws introduced. Device and circuit results are summarized, including a simultaneous 450 GHz f{sub}τ and 490 GHz f{sub}max DHBT, 172-GHz amplifiers with 8.3-dBm output power and 4.5-dB associated power gain, and 150-GHz static frequency dividers (a digital circuit figure-of-merit for a device technology). To compete with advanced 100-nm SiGe processes, InP HBTs must be similarly scaled and high process yields are imperative. Described are several process modules in development: these include an emitter-base dielectric sidewall spacer for increased yield, a collector pedestal implant for reduced extrinsic C{sub}(cb), and emitter junction regrowth for reduced base and emitter resistances.
机译:与SiGe相比,InP HBT具有出色的电子传输性能,但缩放性和寄生减少性却较差。制定了混合信号IC的品质因数,并引入了HBT缩放定律。总结了设备和电路的结果,包括同时进行的450 GHz fDH和490 GHz fmax DHBT,具有8.3dBm输出功率和4.5dB相关功率增益的172GHz放大器以及150GHz静态分频器(设备技术的数字电路品质因数)。为了与先进的100 nm SiGe工艺竞争,InP HBT必须进行类似的缩放,并且必须实现高工艺良率。描述中的几个工艺模块正在开发中:这些模块包括一个用于提高产量的发射极-基极电介质侧壁间隔物,一个用于降低非本征C {sub}(cb)的集电极基座植​​入物,以及一个用于降低基极和发射极电阻的发射极结长。

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