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首页> 外文期刊>IEEE Journal of Solid-State Circuits >Phase noise degradation at high oscillation amplitudes in LC-tunedVCO's
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Phase noise degradation at high oscillation amplitudes in LC-tunedVCO's

机译:LC调谐VCO中高振荡幅度时的相位噪声衰减

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This paper deals with the Single Sideband to Carrier Ratio (SSCR)ndependence on the oscillation amplitude of a fully integrated LC-tunednvoltage-controlled oscillator, fabricated in high-speed bipolarntechnology. As the oscillation amplitude increases, the SSCR reaches anminimum and then steeply rises, setting a limit to the range wherenbetter performance can be traded against higher power dissipation. Thisndependence is fully explained by taking into account that noise andndisturbances modulate the phase delay due to the active elements.nExperimental and simulation procedures for the evaluation of this effectnare presented and their impact on the circuit performance is discussed
机译:本文研究了单边带载波比(SSCR)n取决于高速双极化技术制造的完全集成的LC调谐电压控制振荡器的振荡幅度。随着振荡幅度的增加,SSCR达到最小值,然后陡然上升,从而限制了可以在更好的性能与更高的功耗之间进行权衡的范围。考虑到噪声和干扰会影响有源元件的相位延迟,从而充分说明了这种独立性。给出了评估这种效果的实验和仿真程序,并讨论了其对电路性能的影响。

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