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Simulation and optimisation of terahertz emission from InGaAs and InP photoconductive switches

机译:InGaAs和InP光电导开关的太赫兹发射的仿真和优化

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摘要

We simulate the terahertz emission from laterally biased InGaAs and InP using a three-dimensional carrier dynamics model in order to optimise the semiconductor material. Incident pump-pulse parameters of current Ti:Sapphire and Enfibre lasers are chosen, and the simulation models the semiconductor's bandstructure using parabolic Γ, L and X valleys, and heavy holes. The emitted terahertz radiation is propagated within the semiconductor and into free space using a model based on the Drude-Lorentz dielectric function. As the InGaAs alloy approaches IAs an increase in the emitted power is observed, and this is attributed to a greater electron mobility. Additionally, low-temperature grown and ion-implanted InGaAs are modelled using a finite carrier trapping time. At sub-picosecond trapping times the terahertz bandwidth is found to increase significantly at the cost of a reduced emission power.
机译:为了优化半导体材料,我们使用三维载流子动力学模型模拟了横向偏置的InGaAs和InP的太赫兹发射。选择当前的Ti:Sapphire和Enfibre激光器的入射泵浦脉冲参数,并使用抛物线Γ,L和X谷和重空穴对半导体的能带结构进行仿真。使用基于Drude-Lorentz介电函数的模型,所发射的太赫兹辐射会在半导体内传播并进入自由空间。当InGaAs合金接近IAs时,观察到发射功率的增加,这归因于更大的电子迁移率。此外,使用有限的载流子俘获时间对低温生长和离子注入的InGaAs进行建模。发现在亚皮秒捕获时间,太赫兹带宽显着增加,但代价是发射功率降低。

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