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Pulsed laser deposition of manganese doped GaN thin films

机译:脉冲激光沉积锰掺杂的GaN薄膜

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摘要

Thin films of GaN doped with manganese were grown on sapphire substrates by pulsed laser deposition. The deposition plasma was characterised using a Langmuir ion probe and the film growth process was monitored in situ using optical reflectometry. The films showed higher Mn concentrations than the target preparations, suggesting a loss of gallium during the growth process. Photoluminescence measurements carried out on pure and doped films showed a quenching of the blue-green luminescence with the inclusion of manganese.
机译:通过脉冲激光沉积在蓝宝石衬底上生长掺杂有锰的GaN薄膜。使用Langmuir离子探针对沉积等离子体进行表征,并使用光学反射仪对膜生长过程进行原位监测。该膜显示出比目标制剂更高的Mn浓度,表明在生长过程中镓的损失。在纯净膜和掺杂膜上进行的光致发光测量表明,蓝光和绿光的猝灭伴随着锰的加入。

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