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首页> 外文期刊>Thin Solid Films >Effect of thermal annealing on nebulizer spray deposited tin sulflde thin films and their application in a transparent oxide/CdS/SnS heterostructure
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Effect of thermal annealing on nebulizer spray deposited tin sulflde thin films and their application in a transparent oxide/CdS/SnS heterostructure

机译：热退火对雾化器喷射沉积的硫化锡薄膜的影响及其在透明氧化物/ CdS / SnS异质结构中的应用

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摘要

Tin sulfide (SnS) thin film was deposited on glass substrates using simple nebulizer spray pyrolysis method. The influence of vacuum annealing on structural, optical, morphological, electrical and photovoltaic properties of the films were characterized by X-ray diffraction (XRD), Raman spectroscopy, scanning electron microscopy, atomic force microscopy, energy dispersive analysis of X- ray, UV-Visible spectrophotometry, photoluminescence spectrofluorometry and Hall measurements. Structural parameters such as lattice structure, crystallite size, micro strain and dislocation density were estimated using XRD analysis. There was a notable enhancement in morphology and surface roughness of the films and they were found to vary with respect to the annealing temperature. Optical studies done on the films revealed a decrease in energy gap for the increase of annealing temperatures. From the Hall effect study, it was found that SnS thin films have p-type conductivity. The lowest resistivity and higher carrier concentration were found to be 0.074 Omega cm and 1.07 x 10(19)(cm(-3)) respectively. A heterojunction solar cell, CdS/SnS was fabricated and its solar conversion efficiency obtained was about 0.73% for fin sulfide films annealed at 400 degrees C.
机译：使用简单的喷雾器喷雾热解法将硫化锡（SnS）薄膜沉积在玻璃基板上。通过X射线衍射（XRD），拉曼光谱，扫描电子显微镜，原子力显微镜，X射线的能量色散分析，UV表征了真空退火对薄膜结构，光学，形态，电学和光伏性质的影响。 -可见分光光度法，光致发光光谱荧光法和霍尔测量。使用XRD分析估算了结构参数，例如晶格结构，微晶尺寸，微应变和位错密度。膜的形态和表面粗糙度显着增强，并且发现它们随退火温度而变化。在薄膜上进行的光学研究表明，随着退火温度的升高，能隙减小。根据霍尔效应研究，发现SnS薄膜具有p型导电性。发现最低的电阻率和较高的载流子浓度分别为0.074Ωcm和1.07 x 10（19）（cm（-3））。制备了异质结太阳能电池CdS / SnS，对于在400摄氏度退火的鳍片硫化物薄膜，其太阳能转换效率约为0.73％。

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