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Synthesis and characterization of sol-gel derived La and Sm doped ZnO thin films: A solar light photo catalyst for methylene blue

机译:溶胶-凝胶法制得的La和Sm掺杂ZnO薄膜的合成与表征:亚甲基蓝的日光光催化剂

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摘要

Sol-gel spin coating method have been used to deposit un-doped, La, and Sm-doped ZnO thin films on Si substrate. The influence of Sm and La doping content on various physical properties of ZnO thin films were investigated using x-ray diffraction, photoluminescence spectroscopy, spectroscopy ellipsometry, scanning electron microscope, and four point probe technique. X-ray diffraction analysis reveals that Sm and La ions were successfully incorporated in ZnO lattice and all the thin films are highly crystalline with hexagonal wurtzite structure. Photoluminescence spectroscopy spectra indicates that defect concentration increases on increase in Sm and La content. Refractive index, extinction coefficient and optical band gap were determined from spectroscopy ellipsometry technique. The optical bandgap of ZnO thin films shifts towards higher wavelength (red shift) on incorporating La and Sm because of which its absorption ability for visible portion of electromagnetic radiation increases. The micrographs obtained from scanning electron microscope reveals that morphology consists of wrinkle type structure; the density of the wrinkles seems to be dependent on the dopant concentration as well as on the type of dopant. Remarkable improvement in electrical conductivity have also been observed after doping. Sm-and La-doped ZnO thin films have shown better photocatalytic degradation efficiency for methylene blue under solar light irradiation.
机译:溶胶-凝胶旋涂法已被用于在Si衬底上沉积未掺杂,La和Sm掺杂的ZnO薄膜。利用X射线衍射,光致发光光谱,椭偏光谱,扫描电子显微镜和四点探针技术研究了Sm和La掺杂量对ZnO薄膜各种物理性能的影响。 X射线衍射分析表明,Sm和La离子已成功掺入ZnO晶格中,并且所有薄膜均为具有六角纤锌矿结构的高度结晶。光致发光光谱光谱表明,随着Sm和La含量的增加,缺陷浓度增加。折射率,消光系数和光学带隙是通过椭圆偏振光谱法测定的。 ZnO薄膜的光学带隙在掺入La和Sm时会向更高的波长偏移(红移),因此其对电磁辐射可见光部分的吸收能力增强。从扫描电子显微镜获得的显微照片表明,形态由皱纹型结构组成。皱纹的密度似乎取决于掺杂剂的浓度以及掺杂剂的类型。掺杂后还观察到电导率的显着改善。掺Sm和La的ZnO薄膜在太阳光照射下对亚甲基蓝表现出更好的光催化降解效率。

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