Oxygen diffusion in TiO2 films studied by electron and ion Rutherford backscattering

著录项

• 来源
  《Thin Solid Films》 |2017年第may1期|97-102|共6页
• 作者

  Marmitt G. G.; Nandi S. K.; Venkatachalam D. K.; Elliman R. G.; Vos M.; Grande P. L.;

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• 作者单位

  Univ Fed Rio Grande do Sul, Inst Fis, Porto Alegre, RS, Brazil;

  Australian Natl Univ, Res Sch Phys & Engn, Dept Elect Mat Engn, Canberra, ACT, Australia;

  Australian Natl Univ, Res Sch Phys & Engn, Dept Elect Mat Engn, Canberra, ACT, Australia;

  Australian Natl Univ, Res Sch Phys & Engn, Dept Elect Mat Engn, Canberra, ACT, Australia;

  Australian Natl Univ, Res Sch Phys & Engn, Dept Elect Mat Engn, Canberra, ACT, Australia|Australian Natl Univ, Res Sch Phys & Engn, Atom Lab, Canberra, ACT, Australia|Australian Natl Univ, Res Sch Phys & Engn, Mol Phys Labs, Canberra, ACT, Australia;

  Univ Fed Rio Grande do Sul, Inst Fis, Porto Alegre, RS, Brazil;

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• 收录信息
• 原文格式 PDF
• 正文语种 eng
• 中图分类
• 关键词

  Diffusion; RBS; Electron-RBS;

  机译：扩散;RBS;电子-RBS;