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Growth and morphology of ultra-thin Al films on liquid substrates studied by atomic force microscopy

机译：原子力显微镜研究液态基体上超薄铝膜的生长和形貌

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We study the growth process and morphology evolution of the ultra-thin Al films deposited on silicone oil surfaces by using atomic force microscopy. Initially, the deposited atoms nucleate and form compact clusters on the liquid surfaces. Then the clusters perform Brownian motion and adhere upon impact, which results in the ramified islands. Finally a continuous film forms as the nominal film thickness d increases. The mean size of the grains in the compact clusters and ramified islands is of the order of 10~1 nm. The ultra-thin Al films exhibit a self-affine surface morphology and therefore the dynamic scaling analysis is performed. It is found that the growth exponent β=0.23±0.05. In the range d=0.1-1.0 nm, the roughness exponent α varies from α ≥ 1 to < 1. The physical interpretation for the crossover of the scaling behavior is presented.
机译：我们通过原子力显微镜研究了沉积在硅油表面的超薄铝膜的生长过程和形貌演变。最初，沉积的原子成核并在液体表面上形成紧密的簇。然后，这些星团进行布朗运动并在撞击时粘附，从而产生分叉的岛。最终，随着标称膜厚d的增加，形成连续的膜。致密团簇和枝状岛中晶粒的平均尺寸为10〜1 nm。超薄Al膜表现出自仿射的表面形态，因此进行了动态缩放分析。发现生长指数β＝ 0.23±0.05。在d = 0.1-1.0 nm范围内，粗糙度指数α从α≥1到<1变化。给出了缩放行为交叉的物理解释。

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