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Strain state of bismuth zinc niobate pyrochlore thin films

机译：铌酸铋铋烧绿石薄膜的应变状态

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摘要

The anisotropic strain of bismuth zinc niobate (BZN) cubic pyrochlore thin films deposited on Si, sapphire, MgO, and Vycor glass substrates is characterized through four circle X-ray diffraction and Raman spectroscopy. Based on the X-ray measurements, it is found that all the films exhibit a hydrostatic compressive strain component with those on MgO substrate exhibiting the highest compressive strain component (0.4%). The effect of the compressive state on the local environment for the ions was investigated through Raman spectroscopy. The observed shifts in the peak position for Raman-active modes are consistent with the measured strain states and correlate well with previously reported dielectric properties for BZN films on MgO, Si, and sapphire.
机译：通过四圆X射线衍射和拉曼光谱表征了沉积在Si，蓝宝石，MgO和Vycor玻璃基板上的铌酸铋锌（BZN）立方烧绿石薄膜的各向异性。基于X射线测量，发现所有膜均表现出静水压缩应变分量，而在MgO基材上的膜表现出最高的压缩应变分量（0.4％）。通过拉曼光谱研究了压缩状态对离子局部环境的影响。观察到的拉曼活性模式的峰位置位移与测得的应变状态一致，并且与先前报道的MgO，Si和蓝宝石上的BZN薄膜的介电性能良好相关。

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