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Effect of cobalt doping on the structural and optical properties of TiO_2 films prepared by sol-gel process

机译：钴掺杂对溶胶-凝胶法制备TiO_2薄膜结构和光学性能的影响

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摘要

Pure and cobalt doped titanium dioxide thin films have been prepared on glass and Si (100) substrates by sol-gel spin coating method. The structural and optical properties of the films as a function of cobalt concentration (up to 15 wt.%) have been systematically studied by Rutherford backscattering spectroscopy, X-ray diffraction, Raman spectroscopy, scanning electron microscopy, optical spectroscopy and spectroscopic ellipsometry methods. Rutherford backscattering studies show the presence of cobalt dopant in the films is almost equal to the precursor stoichiometry. Grazing incidence X-ray diffraction and Raman spectroscopy studies confirm the amorphous phase of the as-deposited films and crystalline anatase phase for the films annealed at 600 ℃. The optical spectroscopy measurements show that the films are fully transparent in the visible region and there is a band gap narrowing upon increasing cobalt dopant concentration. The refractive index, band gap (E_g) and thickness of the films were determined from spectroscopic ellipsometry measurements. The refractive index of the films was found to increase from 2.2 to 2.7 with the increase in cobalt concentration with a simultaneous decrease of band gap from 3.1 to 2.8, which is favorable for photocatalytic applications. The packing density of the films was calculated by Clausius-Mossotti relation and is found to increase with cobalt concentration.
机译：已通过溶胶-凝胶旋涂法在玻璃和Si（100）衬底上制备了纯钴掺杂的二氧化钛薄膜。膜的结构和光学性质随钴浓度（最高15 wt。％）的变化已通过卢瑟福背散射光谱，X射线衍射，拉曼光谱，扫描电子显微镜，光学光谱和椭圆偏振光谱法进行了系统研究。卢瑟福的反向散射研究表明，薄膜中钴掺杂剂的存在几乎等于前体化学计量。掠入射X射线衍射和拉曼光谱研究证实了在600℃退火的薄膜的非晶相和锐钛矿的晶相。光谱学测量表明，膜在可见光区域是完全透明的，并且随着钴掺杂剂浓度的增加，带隙变窄。薄膜的折射率，带隙（E_g）和厚度是通过光谱椭偏测量法确定的。发现膜的折射率随着钴浓度的增加而从2.2增加至2.7，同时带隙从3.1降低至2.8，这对于光催化应用是有利的。通过克劳修斯-莫索蒂（Clausius-Mossotti）关系式计算薄膜的堆积密度，发现其随着钴浓度的增加而增加。

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