Corrigendum to 'Principal Component Analysis: Reveal Camouflaged Information in X-Ray Absorption Spectroscopy Photoemission Electron Microscopy of Complex Thin Oxide Films [Thin Solid Films 65 (2018) 75-84]'

Giesen Margret; Jugovac Matteo; Zamborlini Giovanni; Feyer Vitaliy; Gunkel Felix; Mueller David N.

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Corrigendum to 'Principal Component Analysis: Reveal Camouflaged Information in X-Ray Absorption Spectroscopy Photoemission Electron Microscopy of Complex Thin Oxide Films [Thin Solid Films 65 (2018) 75-84]'

机译：“主成分分析”勘误：揭示复合薄氧化物膜的X射线吸收光谱光学显微镜中的伪空信息[薄实体膜65（2018）75-84]'

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《Thin Solid Films》 |2021年第1期|138694.1-138694.1|共1页
作者
Giesen Margret; Jugovac Matteo; Zamborlini Giovanni; Feyer Vitaliy; Gunkel Felix; Mueller David N.;
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Forschungszentrum Julich Peter Grunberg Inst PGI 6 D-52425 Julich Germany;

Forschungszentrum Julich Peter Grunberg Inst PGI 6 D-52425 Julich Germany|Tech Univ Dortmund Expt Phys 6 Otto Hahn Str 4 D-44227 Dortmund Germany;

Forschungszentrum Julich Peter Grunberg Inst PGI 6 D-52425 Julich Germany|CNR Ist Struttura Mat I-34149 Trieste Italy;

Forschungszentrum Julich Peter Grunberg Inst PGI 6 D-52425 Julich Germany;

Forschungszentrum Julich Peter Grunberg Inst PGI 7 D-52425 Julich Germany;

Forschungszentrum Julich Peter Grunberg Inst PGI 6 D-52425 Julich Germany;

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1. Principal component analysis: Reveal camouflaged information in x-ray absorption spectroscopy photoemission electron microscopy of complex thin oxide films [J] . Giesen Margret, Jugovac Matteo, Zamborlini Giovanni, Thin Solid Films . 2018,第NOVa1期

机译：主成分分析：在复杂的薄氧化膜的X射线吸收光谱，光发射电子显微镜中显示伪装的信息
2. Electronic Structure of Ce-Doped and -Undoped Nd_2CuO_4 Superconducting Thin Films Studied by Hard X-Ray Photoemission and Soft X-Ray Absorption Spectroscopy [J] . Horio M., Krockenberger Y., Yamamoto K., Physical review letters . 2018,第25期

机译：硬X射线光发射和软X射线吸收光谱研究Ce掺杂和Nd_2CuO_4和非掺杂Nd_2CuO_4超导薄膜的电子结构
3. Electronic structures of Fe_(3-x)M_xO_4 (M=Mn,Zn) spinel oxide thin films investigated by x-ray photoemission spectroscopy and x-ray magnetic circular dichroism [J] . Junichi Takaobushi, Mizue Ishikawa, Shigenori Ueda, Physical review. B, Condensed Matter And Materials Physics . 2007,第20期

机译：X射线光电子能谱和X射线磁圆二色性研究Fe_（3-x）M_xO_4（M = Mn，Zn）尖晶石氧化物薄膜的电子结构
4. Structural investigation of LN/LT1 superlattice thin films by field effect scanning transmission electron microscopy equipped with electron disspersive x-ray spectroscopy [C] . Kobata T., Tsukahara G., Uesu Y., 2011 International Symposium on Applications of Ferroelectrics (ISAF/PFM) and 2011 International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials . 2011

机译：LN / LT 1 超晶格薄膜的结构研究与电子分散X射线光谱的场效应扫描透射电子显微镜
5. X-ray absorption spectroscopy and microscopy study of ferro- and antiferromagnetic thin films, with applications to exchange anisotropy. [D] . Regan, Thomas Joyce, III. 2001

机译：铁磁和反铁磁薄膜的X射线吸收光谱和显微镜研究，并用于交换各向异性。
6. X-ray Photoelectron Spectroscopy Time-of-flight Secondary Ion Mass Spectrometry and Principal Component Analysis of the Hydrolysis Regeneration and Reactivity of NHS-containing Organic Thin Films [O] . Fang Cheng, Lara J. Gamble, David W. Grainger, -1

机译：X射线光电子能谱飞行时间二次离子质谱法和含NHS的有机薄膜的水解再生和反应性的主成分分析
7. Principal component analysis: Reveal camouflaged information in x-ray absorption spectroscopy photoemission electron microscopy of complex thin oxide films [O] . Margret Giesen, Matteo Jugovac, Giovanni Zamborlini, 2018

机译：主成分分析：揭示复合薄氧化膜X射线吸收光谱光学激发电子显微镜的伪装信息

Corrigendum to 'Principal Component Analysis: Reveal Camouflaged Information in X-Ray Absorption Spectroscopy Photoemission Electron Microscopy of Complex Thin Oxide Films [Thin Solid Films 65 (2018) 75-84]'

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