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Sensitivity Analysis of the Effects of Doubly Charged Ions on Ion Acceleration Grid Erosion

机译:双电荷离子对离子加速网格侵蚀影响的敏感性分析

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A sensitivity analysis was performed using a three-dimensional code to understand the effect of doubly charged ions on the erosion of ion acceleration grids. A preliminary analysis showed that the neutral mass flow rate, estimated by assuming all the ions are singly charged, contained significant error when the doubly charged ion fraction was non-negligible. Calculations were conducted for the μ10 EMI ion acceleration grid system with different doubly charged ion fractions. For fractions of 0.1 and 0.2, which were similar to the experimental conditions, the simulation results for the acceleration grid current and grid mass loss were in good agreement with the experimental data. Calculations showed that when the doubly charged ion fraction was reduced from 0.1 to 0, the acceleration grid current and grid mass loss changed by-14% and-18%, respectively. Further, when the fraction was increased from 0.1 to 0.2, the acceleration grid current and grid mass loss changed by +9.5% and +32%, respectively. Electron backstreaming was also found to vary with the doubly charged ion fraction: it occurred 14% slower when the fraction was decreased from 0.1 to 0 and 12% faster when the fraction was increased from 0.1 to 0.2. The structural failure of the deceleration grid was less sensitive: the deceleration grid eroded 8.3% slower when the doubly charged ion fraction was reduced from 0.1 to 0 and 8.6% faster when the fraction was increased from 0.1 to 0.2.
机译:使用三维代码进行了敏感性分析,以了解双电荷离子对离子加速网格腐蚀的影响。初步分析表明,假设双离子部分不可忽略,通过假设所有离子都带单电荷估算的中性质量流量包含明显的误差。针对具有不同双电荷离子分数的μ10EMI离子加速栅格系统进行了计算。对于与实验条件相似的分数0.1和0.2,加速电网电流和电网质量损失的仿真结果与实验数据吻合良好。计算表明,当双电荷离子分数从0.1降低到0时,加速栅极电流和栅极质量损失分别改变了14%和18%。此外,当分数从0.1增加到0.2时,加速电网电流和电网质量损失分别变化了+ 9.5%和+ 32%。还发现电子逆流随双电荷离子分数的变化而变化:当分数从0.1降低到0时,电子逆流的速度降低了14%,而当分数从0.1升高到0.2时,电子逆流的速度提高了12%。减速栅的结构失效较不敏感:当双电荷离子分数从0.1减小到0时,减速栅的腐蚀速度降低了8.3%,而当分数从0.1增大到0.2时,减速栅的腐蚀速度则提高了8.6%。

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