Scanning tunneling microscope (STM) light emission spectroscopy provides a powerful tool for characterization of individual nanometer scale structures on solid surfaces. However, the light to be detected is usually very weak. It is desirable to improve the in-tensity level for measurements with good signal-to-noise ratio. For this purpose the role that the STM tip-sample gap plays in the light emission is analyzed by the dielectric theory of STM light emission. Based on the theoretical predictions, we discuss how one can obtain strong STM light emission and problems associated with the enhancement of emission.%走査型トンネル電子顕微鏡（Scanning tunneling micrornscope，STM）発光はSTMの試料－探針間の電子トンネルにrnより励起される発光である．探針から放出されるナノサイズrnのトンネル電子ビームが励起源となることから，探針直下のrn試料ナノ物性が発光特性に反映されることが予想され,rnSTM発光計測は表面局所物性探索のための手法として期待rnされている．
展开▼
