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An Error Location and Correction Method for Memory Based on Data Similarity Analysis

机译：基于数据相似度分析的内存错误定位与纠错方法

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摘要

The nanoscale CMOS technology has encountered severe reliability issues, especially in the on-chip memory. As the technology nodes keep shrinking, single-event upsets (SEUs) may encounter more frequent multiple-bit upsets (MBUs) per particle strike. The commonly used memory error correction methods, such as the single-error correction-double-error detection (SEC-DED) code, are no longer feasible. While the counterparts for multiple error correction codes (MECs) yield too costly overhead on delay and data redundancy, especially for MBUs in a word or a character, even with all bits upset, the error correcting ability of the existing error correcting methods is exceeded. In this paper, we introduce a novel block-based error detection and correction method for memory by analyzing the similarity of data. This method of error location and correction can cope with both single-word error (SWE) and multiple-word error (MWE), no matter how many corrupted bits of each word there are. Experimental results on the test system based on SRAM demonstrate that the proposed method can correct single-word-single-bit (SWSB), single-word-multiple-bit (SWMB), multiple-word-single-bit (MWSB), and multiple-word-multiple-bit (MWMB) errors. The proposed method based on block level greatly improved the correction ability with low redundancy, low decoding delay, and moderate complexity versus other homogeneous byte-level or bit-level protection methods. In particular, the detection and correction efficiency is more evident when the data size increases.
机译：纳米级CMOS技术已经遇到了严重的可靠性问题，尤其是在片上存储器中。随着技术节点的不断缩小，单事件击穿（SEU）可能会在每次粒子撞击时遇到更频繁的多位翻转（MBU）。诸如单错误校正-双错误检测（SEC-DED）代码之类的常用内存错误校正方法不再可行。尽管多个纠错码（MEC）的对应物在延迟和数据冗余方面产生了非常昂贵的开销，尤其是对于单词或字符中的MBU，即使所有位都已翻转，但仍超出了现有纠错方法的纠错能力。在本文中，我们通过分析数据的相似性，介绍了一种新颖的基于块的内存错误检测和纠正方法。这种错误定位和纠正方法可以应付单字错误（SWE）和多字错误（MWE），无论每个字有多少损坏位。在基于SRAM的测试系统上的实验结果表明，该方法可以纠正单字单位（SWSB），单字多位（SWMB），多字单位（MWSB）和多字多位（MWMB）错误。与其他同类字节级或位级保护方法相比，基于块级的方法大大提高了校正能力，具有低冗余，低解码延迟和适度的复杂性。特别地，当数据大小增加时，检测和校正效率更加明显。

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