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首页> 外文期刊>Welding and cutting >Depth profile analysis of oxide layers on aluminium filler wire by means of glow discharge optical emission spectroscopy
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Depth profile analysis of oxide layers on aluminium filler wire by means of glow discharge optical emission spectroscopy

机译：辉光放电光发射光谱法分析铝填充焊丝上氧化层的深度分布

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摘要

Aluminium filler wire coils were stored in three different climate conditions to influence the oxide layer on the aluminium surfaces. Samples of the filler wires were investigated with glow discharge optical emission spectroscopy (GOOES), using a commercially available GDOES Universal Sample Unit (USU). The obtained intensity curves and depth profiles are examined and set into relation to one another. The results are reviewed by means of the energy dispersive X-ray spectroscopy (EDX). It is demonstrated that GDOES allows for depth profile analysis of all elements on a wider area of the filler wire surface. Worsening storage conditions lead to an increase of the oxide layer thickness and the hydrogen content. Yet, thick deposits of insulating oxide cannot be sputtered at present day. aluminium oxide layer; glow discharge optical emission spectroscopy (GDOES); aluminium filler wire; Universal Sample Unit (USU); depth profile analysis
机译：铝填充线圈被存储在三种不同的气候条件下，以影响铝表面的氧化层。使用市售的GDOES通用样品装置（USU）通过辉光放电发射光谱（GOOES）研究了填充焊丝的样品。检查所获得的强度曲线和深度轮廓，并将其相互关联。结果通过能量色散X射线光谱（EDX）进行了审查。事实证明，GDOES可以对填充焊丝表面更宽范围内的所有元素进行深度剖面分析。恶化的储存条件导致氧化物层厚度和氢含量的增加。然而，目前不能溅射出厚厚的绝缘氧化物沉积物。氧化铝层辉光放电光发射光谱法（GDOES）;铝填充线通用样品装置（USU）；深度剖面分析

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