Three models for errors in sample locations are studied here. The first model, namely the perturbed systematic sampling, is assumed to have the sampling points are perturbed by independent and identically distributed errors Dk, k ∈ Z. Under the second model, called systematic sampling with cumulative error, the increments between successive sampling points are independent and identically distributed. In the last model, that is, systematic sampling with independent pthinning is applied if observations are lost independently of each other with probability p. (43 refs.)
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