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首页> 外文期刊>Zeitschrift fur Kristallographie. Supplement issue >Refinement of extinction-affected X-ray reflection profile of textures
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Refinement of extinction-affected X-ray reflection profile of textures

机译：细化消光影响的X射线反射轮廓

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摘要

Using first-order approximation of secondary extinction (SE) correction, a method is described for conversion of extinction-affected reflection profile into kinematical (extinc-tion-free) one. In this connection, changes of the two reflection profile parameters integral breadth and FWHM are investigated by means of change of the level of interaction between X-rays and crystal medium. To this end, a controlled reduction of the incident-beam intensity is carried out by means of the transmission factor of a foil crossed by the incident beam. The investigation is confined to 1 1 l and 222 reflections corresponding to the ideal <111> direc-tion of the main texture component of electrodeposited silver coating appearing infinitely thick to the X-rays. It is found that the extinction-induced reflection broadening is controlled by the reflectivity Q, texture factor P and incident-beam intensity I_o.
机译：使用二次消光（SE）校正的一阶近似，描述了一种将消光影响的反射轮廓转换为运动学（无消光）的方法。关于这一点，通过改变X射线与晶体介质之间的相互作用程度来研究两个反射轮廓参数积分宽度和FWHM的变化。为此，借助于入射光束穿过的箔片的透射率来控制入射光束强度。研究仅限于对应于电沉积银涂层的主要织构成分的理想<111>方向的1 1 l和222反射，这些反射对X射线显示为无限厚。发现消光引起的反射展宽受反射率Q，纹理因子P和入射光束强度I_o控制。

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