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Band offsets in III-nitride heterostructures

机译:III型氮化物异质结构中的能带偏移

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摘要

We present a theoretical investigation of band offsets in GaN-based group III-nitride ternary/binary heterostructures with zinc blende structure. The band offsets in InGaN/GaN and AlGaN/GaN heterostructures were studied using the recently proposed extended sp(3) tight binding model (Unlu H 2001 Phys. Status Solidi. b 223 195). Simulations show a small valence band offset in AlGaN/GaN heterostructure and large valence band offset in the InGaN/GaN heterostructure. Furthermore, the tensile strain in AlGaN leads to positive bowing of the conduction band offsets in AlGaN/GaN heterostructure, and the compressive strain in InGaN leads to negative bowing of conduction band offsets in InGaN/GaN heterostructure as a function of composition. Good agreement is found between predictions and experiment. [References: 12]
机译:我们目前对带锌共混物结构的GaN基III族氮化物三元/二元异质结构中的带隙进行了理论研究。使用最近提出的扩展的sp(3)紧密键合模型(Unlu H 2001 Phys。Status Solidi。b 223 195)研究了InGaN / GaN和AlGaN / GaN异质结构中的能带偏移。仿真显示,AlGaN / GaN异质结构中的价带偏移较小,而InGaN / GaN异质结构中的价带偏移较大。此外,AlGaN中的拉伸应变导致AlGaN / GaN异质结构中导带偏移的正弯曲,而InGaN中的压缩应变导致InGaN / GaN异质结构中的导带偏移根据组成的负弯曲。在预测和实验之间找到了很好的一致性。 [参考:12]

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