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Interferometric measurement of phase change on reflection

机译:反射相变的干涉测量

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We show an interferometric method for measuring phase change with known uncertainty. Because this measurement uses the backreflection from a sample, the height is intrinsically removed, and only the phase change is measured. The uncertainty in the phase change measurement is +-3.8 deg and is dominated by the background subtraction method. We also investigate the effect of the phase change on the interferometric radius measurement. The theoretical worst-case error in the interferometric radius measurement due to the phase change is 30 nm.
机译:我们展示了一种干涉法,用于测量具有已知不确定度的相变。由于此测量使用的是样品的背向反射,因此会从本质上消除高度,并且仅测量相变。相变测量中的不确定度为+ -3.8度,由背景减法控制。我们还研究了相变对干涉半径测量的影响。相变引起的干涉半径测量中的理论最坏情况误差为30 nm。

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