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Broadband wavelength and angle-resolved scattering characterization for nanophotonics investigations

机译：纳米光子学研究的宽带波长和角度分辨散射特性

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摘要

The characterization of scattered light is complex and relatively nonstandardized despite being of great importance to many optical technologies. While total scatter can be efficiently measured using integrating-sphere-based techniques, a detailed determination of the full bidirectional scattering distribution function is far more challenging, often requiring complicated and expensive equipment as well as substantial measurement time. Due to this, many research groups rely on simpler, angle-resolved scattering (ARS) measurements, yet these are typically carried out using a single wavelength source, therefore providing limited information. Here, we demonstrate a custom-built broadband angle-resolved optical spectrometer, which utilizes a supercontinuum white light laser source combined with a custom automated goniometer and a Si CCD array spectrometer in order to carry out broad spectral measurements of ARS. The use of a collimated supercontinuum allows for small area measurements that are often crucial for investigation of nanophotonic samples created using expensive fabrication techniques. The system has been tested and calibrated, and accuracy and reproducibility have been verified by integrating wavelength and ARS data over the angular range and comparing to calibrated integrating sphere measurements. (C) 2015 Optical Society of America
机译：尽管对许多光学技术非常重要，但散射光的表征非常复杂且相对不规范。虽然可以使用基于积分球的技术有效地测量总散射，但是要确定完整的双向散射分布函数要困难得多，通常需要复杂且昂贵的设备以及大量的测量时间。因此，许多研究小组都依赖于更简单的角度分辨散射（ARS）测量，但是这些测量通常使用单个波长源进行，因此提供的信息有限。在这里，我们演示了定制的宽带角度分辨光谱仪，该光谱仪将超连续谱白光激光源与定制的自动测角仪和Si CCD阵列光谱仪结合使用，以进行ARS的宽光谱测量。准直超连续谱的使用允许进行小面积测量，这对于使用昂贵的制造技术创建的纳米光子样品的研究通常至关重要。该系统已经过测试和校准，并且通过对整个角度范围内的波长和ARS数据进行积分并与校准后的积分球测量结果进行比较，从而验证了准确性和可重复性。 （C）2015年美国眼镜学会

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