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Ultrahigh-sensitivity infrared detection system using an InGaAs p-i-n photodiode with low dielectric polarization noise

机译:使用具有低介电极化噪声的InGaAs p-i-n光电二极管的超高灵敏度红外检测系统

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We developed a highly sensitive infrared photodetection system using an InGaAs p-i-n photodiode. The temperature and data sampling rate dependences of the readout noise were measured to determine the optimum temperature for low-noise detection. The optimum temperature for sampling rates below 100 Hz was 100 K, and the readout noise at 1 Hz was 2.5 e. The readout noise at 1 MHz and 140 K was 49.4 e. The light detection limit of the system was 8.2 X 10~(-19) W at a wavelength of 1.3 (mu)m. The spectral noise densities of a readout circuit were measured in order to determine the origin of noise.
机译:我们开发了使用InGaAs p-i-n光电二极管的高灵敏度红外光电检测系统。测量读出噪声的温度和数据采样率相关性,以确定低噪声检测的最佳温度。低于100 Hz的采样率的最佳温度为100 K,1 Hz的读出噪声为2.5 e。 1 MHz和140 K时的读出噪声为49.4 e。该系统在1.3μm的波长下的光检测极限为8.2×10〜(-19)W。测量读出电路的频谱噪声密度,以确定噪声的来源。

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