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首页> 外文期刊>Physica, B. Condensed Matter >Electrical conduction properties of Si δ-doped GaAs grown by MBE
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Electrical conduction properties of Si δ-doped GaAs grown by MBE

机译:MBE生长的Siδ掺杂GaAs的导电特性

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摘要

The temperature dependent Hall effect and resistivity measurements of Si δ-doped GaAs are performedin a temperature range of 25-300 K. The temperature dependence of carrier concentration shows acharacteristic minimum at about 200 K, which indicates a transition from the conduction bandconduction to the impurity band conduction. The temperature dependence of the conductivity resultsare in agreement with terms due to conduction band conduction and localized state hoppingconduction in the impurity band. It is found that the transport properties of Si 6-doped GaAs are mainlygoverned by the dislocation scattering mechanism at high temperatures. On the other hand, theconductivity follows the Mott variable range hopping conduction (VRH) at low temperatures in thestudied structures.
机译:Siδ掺杂的GaAs的温度依赖性霍尔效应和电阻率测量在25-300 K的温度范围内进行。载流子浓度的温度依赖性在约200 K处显示出特性最小值,这表明从导带导电过渡到杂质带导。电导率结果的温度依赖性与由于杂质带中的导带导通和局部状态跳跃导通而引起的项一致。发现在高温下,Si 6掺杂GaAs的输运性能主要受位错散射机制控制。另一方面,在所研究的结构中,电导率遵循低温下的Mott变程跳变传导(VRH)。

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