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首页> 外文期刊>Physica, B. Condensed Matter >Analysis of the dielectric constants of the Ag2O film by spectroscopic ellipsometry and single-oscillator model
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Analysis of the dielectric constants of the Ag2O film by spectroscopic ellipsometry and single-oscillator model

机译：用椭圆偏振光谱法和单振子模型分析Ag2O薄膜的介电常数

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Ag2O film was prepared on glass substrate by direct current reactive magnetron sputtering under a careful control of the preparation parameters. The analysis of the dielectric constants of the Ag2O film related to the optical properties was conducted by spectroscopic ellipsometry (SE) and single-oscillator model. The dielectric constants were fitted in terms of general oscillator model (a model combined with three Tauc-Lorentz oscillator models) by using the measured SE data. Refractive-index dispersion data below the interband absorption edge of the Ag2O film were analyzed using a single oscillator fit of the form n(2)-1 = EdE0/(E-0(2) -(sic) omega(2)) proposed by Wemple and DiDomenico, where h omega is the photon energy, Eo is the single oscillator energy, and E-d is the dispersion energy. The optical energy gap of approximately 2.32 eV was fitted by single oscillator model, which was in good agreement with that in terms of Tauc relation. The fitted dispersion energy Ed of approximately 20.28 eV determined the parameter P of approximately 0.32 by a simple empirical relationship E-d = beta N(c)Z(a)N(e), which indicated that Ag2O film falls into covalent class. Additionally, the band gap parameter E-a and plasma frequency (sic)omega(p) fitted were 1.16 and 4.85 eV, respectively.
机译：在制备参数的严格控制下，通过直流反应磁控溅射在玻璃基板上制备Ag2O膜。 Ag2O薄膜的介电常数与光学性能相关的分析是通过光谱椭偏法（SE）和单振子模型进行的。通过使用测得的SE数据，将介电常数拟合为一般的振荡器模型（与三个Tauc-Lorentz振荡器模型组合的模型）。使用建议的n（2）-1 = EdE0 /（E-0（2）-（sic）omega（2））形式的单振荡器拟合分析了Ag2O薄膜带间吸收边缘以下的折射率色散数据由Wemple和DiDomenico撰写，其中ω是光子能量，Eo是单振荡器能量，Ed是色散能量。单振荡器模型拟合了约2.32 eV的光能隙，这与Tauc关系很好。通过简单的经验关系式E-d = beta N（c）Z（a）N（e），拟合的分散能Ed约为20.28 eV，确定参数P约为0.32，这表明Ag2O膜属于共价类。此外，带隙参数E-a和拟合的等离子体频率（sic）omega（p）分别为1.16和4.85 eV。

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