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首页> 外文期刊>The journal of physical chemistry, C. Nanomaterials and interfaces >N2O Adsorption on the Surface of MgO(001) Thin Films: An Infrared and TPD Study
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N2O Adsorption on the Surface of MgO(001) Thin Films: An Infrared and TPD Study

机译:N2O在MgO(001)薄膜表面的吸附:红外和TPD研究

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摘要

The adsorption of N2O on the surface of MgO(001) thin films has been studied at low temperature (60 K) using infrared reflection-absorption spectroscopy (IRAS) and temperature-programmed desorption (TPD). The observed infrared spectrum consists of several components indicating different adsorption sites for N2O. The different IR peaks can be related to particular thermal desorption features by combining the TPD spectra with temperature-dependent infrared measurement. By comparing spectra from films with different roughness and different supports, a band at 2236 cm~(-1) can be assigned to N2O adsorbed on the MgO terraces, while peaks at the higher frequency are assigned to molecules adsorbed on low-coordinated sites.
机译:使用红外反射吸收光谱法(IRAS)和程序升温脱附(TPD)在低温(60 K)下研究了Ng在MgO(001)薄膜表面的吸附。观察到的红外光谱由几种成分组成,这些成分表明N2O的吸附位置不同。通过将TPD光谱与温度相关的红外测量值结合起来,可以将不同的IR峰与特定的热脱附特征相关。通过比较具有不同粗糙度和不同支撑物的薄膜的光谱,可以将2236 cm〜(-1)的谱带分配给MgO台阶上吸附的N2O,而将较高频率的峰分配给吸附在低配位点上的分子。

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