• 主题
高级搜索  >
历史搜索 清空历史
首页> 外文期刊>Nature reviews Cancer >Probing Exfoliated Graphene Layers and Their Lithiation with Microfocused X-rays
【24h】

Probing Exfoliated Graphene Layers and Their Lithiation with Microfocused X-rays

机译：用微煤X射线探测剥落的石墨烯层及其锂化

获取原文
获取原文并翻译 | 示例
           
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

X-ray diffraction is measured on individual bilayer and multilayer graphene single-crystals and combined with electrochemically induced lithium intercalation. In-plane Bragg peaks are observed by grazing incidence diffraction. Focusing the incident beam down to an area of about 10 mu m X 10 mu m, individual flakes are probed by specular X-ray reflectivity. By deploying a recursive Parratt algorithm to model the experimental data, we gain access to characteristic crystallographic parameters of the samples. Notably, it is possible to directly extract the bi/multilayer graphene c-axis lattice parameter. The latter is found to increase upon lithiation, which we control using an on-chip peripheral electrochemical cell layout. These experiments demonstrate the feasibility of in situ X-ray diffraction on individual, micron-sized single crystallites of few- and bilayer two-dimensional materials.
机译：在各个双层和多层石墨烯单晶上测量X射线衍射，并与电化学诱导的锂嵌入结合。 通过放牧入射衍射观察平面内布拉格峰。 将入射光光束聚焦到约10μm×10μm的面积，通过镜面X射线反射率探测单个薄片。 通过部署递归Parratt算法来模拟实验数据，我们可以访问样本的特征晶体参数。 值得注意的是，可以直接提取BI /多层石墨烯C轴晶格参数。 后者被发现在锂化时增加，我们使用片上外围电化学电化学电影布局控制。 这些实验证明了原位X射线衍射对几种和双层二维材料的个体，微生物单晶的可行性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号