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Angle-resolved photoemission spectroscopic facility for surfaceelectronic structure characterization

机译:用于表面电子结构表征的角度分辨光发射光谱仪

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摘要

We describe a new facility that has been established at Saha Institute of Nuclear Physics for detailed surfaceelectronic structure characterization of crystalline materials. Angle-resolved photoemission spectroscopy(ARPES) experiments are of vital importance in elucidating the relation between the electronic, magnetic andchemical structure of solid surfaces. This state-of-the-art facility provides high energy and angular resolutionsfor modern day ARPES measurements and allows different measurements such as band-structure mapping,Fermi-surface mapping and photoelectron diffraction. We present here the details of this facility along withexperimental results on highly oriented pyrolytic graphite to demonstrate the performance of this instrument.
机译:我们描述了萨哈核物理研究所已经建立的一种新设施,用于对晶体材料进行详细的表面电子结构表征。角分辨光发射光谱(ARPES)实验对于阐明固体表面的电子,磁性和化学结构之间的关系至关重要。这种先进的设施可为现代ARPES测量提供高能量和角分辨率,并允许进行不同的测量,例如能带结构映射,费米表面映射和光电子衍射。我们在此介绍该设备的详细信息,以及在高取向热解石墨上的实验结果,以证明该仪器的性能。

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