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Crystal structure refinement from electron diffraction data

机译:通过电子衍射数据细化晶体结构

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摘要

A procedure of crystal structure refinement from electron diffraction data is described. The electron diffraction data on polycrystalline films are processed taking into account possible overlap of reflections and two-beam interaction. The diffraction from individual single crystals in an electron microscope equipped with a precession attachment is described using the Bloch-wave method, which takes into account multibeam scattering, and a special approach taking into consideration the specific features of the diffraction geometry in the precession technique. Investigations were performed on LiF, NaF CaF2, and Si crystals. A method for reducing experimental data, which allows joint electron and X-ray diffraction study, is proposed.
机译:描述了根据电子衍射数据细化晶体结构的过程。考虑到反射的可能重叠和两束相互作用,对多晶膜上的电子衍射数据进行处理。使用布洛赫波方法描述了配备了进动附件的电子显微镜中单个单晶的衍射,该方法考虑了多光束散射,并且考虑到了进动技术中衍射几何的特定特征,采用了特殊方法。对LiF,NaF CaF2和Si晶体进行了研究。提出了一种减少实验数据的方法,该方法可以进行电子和X射线衍射研究。

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