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Beam characterization by means of emission spectroscopy in the ELISE test facility

机译：ELISE测试设施中发射光谱法的光束特征

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The ELISE (extraction from a large ion source experiment) test facility at IPP Garching hosts a RF H- / D(-)ion source and an acceleration system. Its target is to demonstrate the performance foreseen for the ITER neutral beam injector (NBI) system in terms of extracted current density (H / D), fraction of co-extracted electrons and pulse duration. The size of the ELISE extraction area is half that foreseen for the ITER NBI. This paper presents a detailed study of the ELISE beam divergence and uniformity. In particular, it was possible to describe the beam as the sum of two components at very different divergence: about 2 degrees versus 5 degrees/ 7 degrees. As test cases, the beam properties have been measured as function of two source parameters. The first one is the current flowing through the grid facing the plasma, the plasma grid (PG), in order to generate the magnetic filter field. The second one is the bias current flowing between the PG and the source walls. Both the filter field and the bias current influence the fraction of co-extracted electrons, but also the properties of the plasma just in front of the extraction system and the beam properties. The divergence and the uniformity of the beam have been measured by a beam emission spectroscopy (BES) diagnostic; the detailed analysis of the raw spectra collected by BES led to describing the beam with two components of different divergence. This concept has been supported by the information given by thermal imaging of the diagnostic calorimeter. Further support to the proposed beam model has been found in the behavior of the currents flowing in the acceleration system and beamline components; these currents are given by the most divergent (charged) particles of the beam.
机译：ELISE（从大离子源实验中提取）IPP GARCHING的测试设施宿主RF H-/ D（ - ）离子源和加速系统。其目标是在提取的电流密度（H / D）方面，以提取的电流密度（H / D），共同提取的电子和脉冲持续时间的一部分来证明Everer中性光束注射器（NBI）系统的性能。 ELISE提取区域的大小为AETER NBI的一半。本文提出了对ELISE射线分歧和均匀性的详细研究。特别地，可以将光束描述为两个组分的总和在非常不同的发散情况下：约2度与5度/ 7度。作为测试用例，梁属性已被测量为两个源参数的功能。第一个是流过面向等离子体的网格的电流，等离子体网格（PG），以产生磁滤波器场。第二个是在PG和源壁之间流动的偏置电流。滤波器场和偏置电流都影响共用电子的分数，还影响了诸如在提取系统的前面的等离子体的性质和梁属性。光束发射光谱（BES）诊断测量光束的发散和均匀性; BES LED收集的原始光谱的详细分析，以描述不同发散的两个组分的光束。通过诊断量热计的热成像给出的信息支持该概念。在加速度系统和光束线组件流动的电流的行为中发现了对所提出的光束模型的进一步支持;这些电流由光束的最分歧（充电）颗粒给出。

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