Picometer-differential twice-exposed element for three-dimensional measurement with extremely long depth of field

Li Chao; Zhou Changhe; Lu Yunkai; Miao Chaofeng; Yu Junjie; Yin Zhengkun; Ye Jin

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Picometer-differential twice-exposed element for three-dimensional measurement with extremely long depth of field

机译：Picometer - 差动两次暴露的元素，用于三维测量，具有极长的景深

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The accuracy of optical three-dimensional (3D) shape measurement is always influenced by the defocusing of a projection or imaging system. In this paper, a novel optical element made by picometer-differential twice-exposed holography, called a picometer comb, is proposed to generate the projection pattern for 3D shape measurement. Two interference fields with picometer-scale period difference are recorded on a substrate to fabricate the picometer comb by twice-exposed laser holography; this element reconstructs the diffraction field, which is essentially the interference between the holograms of two object waves with a slight angle. This picometer comb has the advantage of the generation of a stable light field distribution with extremely long depth of field and small divergence angle. We demonstrate that this diffraction field provides a solution for non-defocusing 3D shape measurement. (C) 2020 Optical Society of America

机译：光学三维（3D）形状测量的精度总是受到投影或成像系统的散焦的影响。在本文中，提出了一种由皮肤差差分两次暴露的全面全息术进行的新型光学元件，被称为皮色仪梳子，以产生用于3D形测量的投影图案。两个具有微微尺度周期差异的干扰场在基板上记录以通过两次暴露的激光全息术制造皮肤仪梳状; 该元素重建衍射场，其基本上是具有轻微角度的两个物体波的全息图之间的干扰。这种皮影率梳子具有产生稳定的光场分布的优点，具有极长的景深和小的发散角度。我们表明该衍射场为非散焦3D形状测量提供了一种解决方案。（c）2020美国光学学会

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来源
《Applied optics》 |2020年第17期|共6页
作者
Li Chao; Zhou Changhe; Lu Yunkai; Miao Chaofeng; Yu Junjie; Yin Zhengkun; Ye Jin;
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作者单位

Chinese Acad Sci Shanghai Inst Opt &

Fine Mech Lab Informat Opt &

Optoelect Technol POB 800-211 Shanghai 201800 Peoples R China;

Chinese Acad Sci Shanghai Inst Opt &

Fine Mech Lab Informat Opt &

Optoelect Technol POB 800-211 Shanghai 201800 Peoples R China;

Chinese Acad Sci Shanghai Inst Opt &

Fine Mech Lab Informat Opt &

Optoelect Technol POB 800-211 Shanghai 201800 Peoples R China;

Chinese Acad Sci Shanghai Inst Opt &

Fine Mech Lab Informat Opt &

Optoelect Technol POB 800-211 Shanghai 201800 Peoples R China;

Chinese Acad Sci Shanghai Inst Opt &

Fine Mech Lab Informat Opt &

Optoelect Technol POB 800-211 Shanghai 201800 Peoples R China;

Chinese Acad Sci Shanghai Inst Opt &

Fine Mech Lab Informat Opt &

Optoelect Technol POB 800-211 Shanghai 201800 Peoples R China;

Chinese Acad Sci Shanghai Inst Opt &

Fine Mech Lab Informat Opt &

Optoelect Technol POB 800-211 Shanghai 201800 Peoples R China;

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Picometer-differential twice-exposed element for three-dimensional measurement with extremely long depth of field

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