Simultaneous displacement and slope measurement in electronic speckle pattern interferometry using adjustable aperture multiplexing

Lu Min; Wang Shengjia; Aulbach Laura; Koch Alexander W.

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Simultaneous displacement and slope measurement in electronic speckle pattern interferometry using adjustable aperture multiplexing

机译：电子散斑图案干涉测量中的同步位移和斜率测量使用可调节孔径复用

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This paper suggests the use of adjustable aperture multiplexing (AAM), a method which is able to introduce multiple tunable carrier frequencies into a three-beam electronic speckle pattern interferometer to measure the out-of-plane displacement and its first-order derivative simultaneously. In the optical arrangement, two single apertures are located in the object and reference light paths, respectively. In cooperation with two adjustable mirrors, virtual images of the single apertures construct three pairs of virtual double apertures with variable aperture opening sizes and aperture distances. By setting the aperture parameter properly, three tunable spatial carrier frequencies are produced within the speckle pattern and completely separate the information of three interferograms in the frequency domain. By applying the inverse Fourier transform to a selected spectrum, its corresponding phase difference distribution can thus be evaluated. Therefore, we can obtain the phase map due to the deformation as well as its slope of the test surface from two speckle patterns which are recorded at different loading events. By this means, simultaneous and dynamic measurements are realized. AAM has greatly simplified the measurement system, which contributes to improving the system stability and increasing the system flexibility and adaptability to various measurement requirements. This paper presents the AAM working principle, the phase retrieval using spatial carrier frequency, and preliminary experimental results. (C) 2016 Optical Society of America

机译：本文建议使用可调节孔径复用（AAM），该方法能够将多个可调谐载波频率引入三梁电子散斑图案干涉仪以同时测量平面外位移及其一阶衍生物。在光学布置中，两个单个孔位于物体和参考光路中。在与两个可调节镜的合作中，单个孔的虚拟图像构造了三对虚拟双孔，具有可变光圈开口尺寸和孔径距离。通过正确设置光圈参数，在散斑图案中产生三个可调空间载波频率，并完全分离频域中的三个干涉图的信息。通过将逆傅里叶变换应用于所选频谱，因此可以评估其相应的相位差分布。因此，我们可以通过变形来获得相位贴图以及从两种散斑图案的测试表面的斜率，这些散斑图案被记录在不同的装载事件中。通过这种方式，实现了同时和动态测量。 AAM大大简化了测量系统，这有助于提高系统稳定性并提高系统灵活性和对各种测量要求的适应性。本文介绍了AAM工作原理，使用空间载波频率的相位检索，以及初步实验结果。（c）2016年美国光学学会

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《Applied optics》 |2016年第22期|共8页
作者
Lu Min; Wang Shengjia; Aulbach Laura; Koch Alexander W.;
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Tech Univ Munich Inst Measurement Syst &

Sensor Technol Theresienstr 90-N5 D-80333 Munich Germany;

Tech Univ Munich Inst Measurement Syst &

Sensor Technol Theresienstr 90-N5 D-80333 Munich Germany;

Tech Univ Munich Inst Measurement Syst &

Sensor Technol Theresienstr 90-N5 D-80333 Munich Germany;

Tech Univ Munich Inst Measurement Syst &

Sensor Technol Theresienstr 90-N5 D-80333 Munich Germany;

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Simultaneous displacement and slope measurement in electronic speckle pattern interferometry using adjustable aperture multiplexing

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