Z-scan measurements of nonlinear refraction and absorption for aluminum-doped zinc oxide thin film

Xu Yixiang; Lu Yuangang; Zuo Yujie; Xu Feng; Zuo Dunwen

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Z-scan measurements of nonlinear refraction and absorption for aluminum-doped zinc oxide thin film

机译：铝掺杂氧化锌薄膜非线性折射和吸收的Z扫描测量

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In this paper, we investigate third-order nonlinearities in aluminum-doped zinc oxide (AZO) thin film by the Z-scan method at a wavelength of 1064 nm. We carried out experiments under different pulse widths (26 ns, 62 ns, and 101 ns) and energy densities (5.3 J/cm(2), 10.6 J/cm(2), and 15.9 J/cm(2)) and obtained the nonlinear absorption coefficient, nonlinear refractive index, and third-order nonlinear susceptibility of AZO thin film. The Z-scan results show that AZO thin film exhibits a larger nonlinear refractive index (-5.48 x 10(-13) m(2)/W) and third-order nonlinear susceptibility (1.97 x 10(-6) esu) than those of some other semiconductor materials at the wavelength of 1064 nm. This suggests that AZO thin film may be a very promising nonlinear medium for nonlinear photonics applications in the tens of nanoseconds regime. (C) 2019 Optical Society of America

机译：在本文中，我们通过在1064nm波长的波长下调查铝掺杂氧化锌（偶氮）薄膜中的三阶非线性。我们在不同的脉冲宽度（26ns，62ns和101ns）和能量密度下进行实验（5.3J / cm（2），10.6J / cm（2）和15.9J / cm（2））并获得偶氮薄膜的非线性吸收系数，非线性折射率和三阶非线性敏感性。 Z-扫描结果表明，偶氮薄膜表现出较大的非线性折射率（-5.48×10（-13）m（2）/ w）和三阶非线性敏感性（1.97×10（-6）ESU）在1064nm波长的其他一些半导体材料中。这表明偶氮薄膜可以是用于数十纳秒内的非线性光子应用的非常有前途的非线性介质。（c）2019年光学学会

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《Applied optics》 |2019年第22期|共6页
作者
Xu Yixiang; Lu Yuangang; Zuo Yujie; Xu Feng; Zuo Dunwen;
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Nanjing Univ Aeronaut &

Astronaut Coll Astronaut Nanjing 211106 Jiangsu Peoples R China;

Nanjing Univ Aeronaut &

Astronaut Coll Astronaut Nanjing 211106 Jiangsu Peoples R China;

Nanjing Univ Aeronaut &

Astronaut Coll Sci Nanjing 211106 Jiangsu Peoples R China;

Nanjing Univ Aeronaut &

Astronaut Coll Mech &

Elect Engn Nanjing 210016 Jiangsu Peoples R China;

Nanjing Univ Aeronaut &

Astronaut Coll Mech &

Elect Engn Nanjing 210016 Jiangsu Peoples R China;

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Z-scan measurements of nonlinear refraction and absorption for aluminum-doped zinc oxide thin film

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