Corrected equations for the determination of a particle position using the interferometric particle imaging technique

Lu Qieni; Wang Leran; Yu Xiaoxue; Xu Jie

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Corrected equations for the determination of a particle position using the interferometric particle imaging technique

机译：使用干涉粒子成像技术确定粒子位置的校正方程

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A new interferometric particle imaging (IPI) simulator is developed based on Fourier optics. With this model, the optical field distribution of any kind of IPI setup at any location, such as on the focused and the defocused image planes, can be easily generated. In addition, the geometric center of a particle image and the image of the particle center on focused and defocused image planes can then be assessed in detail with the IPI simulator by the optical ray tracing method. The size effect of the defocused image is investigated, and the new expression of the calculated defocused image size is given, which can produce higher accuracy in particle locating. (C) 2019 Optical Society of America

机译：基于傅立叶光学开发了一种新的干涉式粒子成像（IPI）模拟器。利用该模型，可以容易地生成任何位置处的任何类型的IPI设置的光场分布，例如聚焦和离焦图像平面。另外，可以通过光学射线示踪方法详细评估粒子图像的几何中心和粒子中心的聚焦和散焦图像平面上的粒子中心的图像。研究了离焦图像的尺寸效果，并给出了计算出的离焦图像尺寸的新表达，这可以产生更高的粒子定位精度。（c）2019年光学学会

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《Applied optics》 |2019年第18期|共7页
作者
Lu Qieni; Wang Leran; Yu Xiaoxue; Xu Jie;
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Tianjin Univ Sch Optoelect &

Precis Instrument Engn Key Lab Optoelect Informat Technol Minist Educ Tianjin 300072 Peoples R China;

Tianjin Univ Sch Optoelect &

Precis Instrument Engn Key Lab Optoelect Informat Technol Minist Educ Tianjin 300072 Peoples R China;

Tianjin Univ Sch Optoelect &

Precis Instrument Engn Key Lab Optoelect Informat Technol Minist Educ Tianjin 300072 Peoples R China;

Tianjin Univ Sch Optoelect &

Precis Instrument Engn Key Lab Optoelect Informat Technol Minist Educ Tianjin 300072 Peoples R China;

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Corrected equations for the determination of a particle position using the interferometric particle imaging technique

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