Simultaneous 3D measurement of deformation and its first derivative with speckle pattern interferometry and shearography

Zhao Qihan; Chen Weijie; Sun Fangyuan; Yan Peizheng; Ye Bing; Wang Yonghong

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Simultaneous 3D measurement of deformation and its first derivative with speckle pattern interferometry and shearography

机译：散斑图案干涉测量和沉焦的变形及其第一衍生物的同时测量

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Digital speckle pattern interferometry and digital shearography are widely used in nondestructive testing due to their advantages of high speed, full field, and high sensitivity. However, traditional speckle pattern interferometry and shearography can only measure a single variable of deformation or strain. This study presents a modified common measurement setup that can simultaneously measure deformation and its first derivative. In the optical setup, a reference beam is introduced behind the shearing device to interfere with the object beams, thereby simplifying the spectrum and improving the quality of the phase maps. Then the spatial carrier technology is used to extract phase and achieve dynamic measurements. The proposed system also expands the measurement range using a 4f system. This study also presents a 3D optical setup based on the 1D system, which is more suitable for practical measurement applications in industrial areas. Theoretical derivation and experimental results are described and presented. (C) 2019 Optical Society of America

机译：由于其高速，全场和高灵敏度，数字斑点图案干涉测量和数字剪切广泛应用于非破坏性测试。然而，传统的散斑图案干涉测量和牧草性只能测量变形或菌株的单个变量。本研究提出了一种改进的公共测量设置，可以同时测量变形及其第一衍生物。在光学设置中，引入剪切装置后面的参考光束以干扰对象波束，从而简化频谱并提高相位图的质量。然后，空间载体技术用于提取相位并实现动态测量。所提出的系统还使用4F系统扩展测量范围。本研究还介绍了基于1D系统的3D光学设置，这更适合工业区的实用测量应用。描述和呈现了理论衍生和实验结果。（c）2019年光学学会

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来源
《Applied optics》 |2019年第31期|共8页
作者
Zhao Qihan; Chen Weijie; Sun Fangyuan; Yan Peizheng; Ye Bing; Wang Yonghong;
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作者单位

Hefei Univ Technol Sch Instrument Sci &

Optoelect Engn Hefei 230009 Anhui Peoples R China;

Hefei Univ Technol Sch Instrument Sci &

Optoelect Engn Hefei 230009 Anhui Peoples R China;

Hefei Univ Technol Sch Instrument Sci &

Optoelect Engn Hefei 230009 Anhui Peoples R China;

Hefei Univ Technol Sch Instrument Sci &

Optoelect Engn Hefei 230009 Anhui Peoples R China;

Hefei Univ Technol Sch Elect Sci &

Appl Phys Hefei 230009 Anhui Peoples R China;

Hefei Univ Technol Sch Instrument Sci &

Optoelect Engn Hefei 230009 Anhui Peoples R China;

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Simultaneous 3D measurement of deformation and its first derivative with speckle pattern interferometry and shearography

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